Amplitude Shift Keying / Frequency Shift Keying

Experiments:

1. To measure the parameters of various control signals.
   • Word pulse with reference to clock
   • 8 bit digital data of NRZ (Non Return to Zero) pattern
   • Data rate/select clock rate (300/600bps) to word pulse
2. To measure the different signals involved in ASK generation
   • Mark Frequency (10 KHz).
   • ASK modulated output
3. To measure the characteristics of ASK demodulator
   • LPF and BPF output.
   • Envelope detector output.
   • ASK demodulated output
4. To measure the different signals involved in FSK generation
   • 8bit digital data of NRZ pattern
   • Mark frequency (10 KHz).
   • Space frequency (5 KHz).
   • FSK modulated output
5. To measure the characteristics of FSK demodulator
   • LPF and BPF outputs.
   • Envelope detector output.
   • FSK demodulated output
6. Frequency Separation study.

Technical Specification:

FEATURES:

• All IC's are mounted on machined IC base.
• PCB's are SMOBC finished with glass epoxy coating.
• Multi color printed block diagram is given on the top of the kit.
• Testing point at the end of each functional block.
• 2⁸ or 256 data pattern combinations available through dip switches.
• The trainer kit is enclosed in fiber glass box for safe keep

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